Spectroscopic ellipsometry of superparamagnetic nanoparticles in thin films of poly(N-isopropylacrylamide)

The versatility of spectroscopic Vis-ellipsometry to determine thin film properties was used to study Fe3O4-nanoparticles embedded in thin films of poly(N-isopropylacrylamide)

Sebastian Rauch; Klaus-Jochen Eichhorn; Manfred Stamm; Petra Uhlmann

2012

Key concepts

Scholarcy highlights

  • The versatility of spectroscopic Vis-ellipsometry to determine thin film properties was used to study Fe3O4-nanoparticles embedded in thin films of poly(N-isopropylacrylamide)
  • It was found that the best-fit results from SE matched well with data from SEM until 1 vol %
  • Over the whole concentration range the data obtained from SE measurements matched well with the suspended values and showed an expected linear behavior
  • In the measured spectral range the data showed a physical meaningful behavior and the influence of the NP on the optical properties of the thin films could be observed

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