Tracking the light-driven layer stacking of graphene oxide

We demonstrate time-resolved electron diffraction for monitoring the structural dynamics during the layer stacking of Graphene oxide induced by ultraviolet photoexcitation

Masaki Hada; Satoshi Ohmura; Yuki Yamamoto; Yoshiya Kishibe; Wataru Yajima; Ryo Shikata; Tomohiro Iguchi; Keishi Akada; Shoji Yoshida; Jun-ichi Fujita; Shin-ya Koshihara; Yuta Nishina

2021

Scholarcy highlights

  • Layer stacking of two-dimensional materials, such as graphene and transition metal dichalcogenides, is critical for controlling their physical and transport properties
  • We demonstrate time-resolved electron diffraction for monitoring the structural dynamics during the layer stacking of Graphene oxide induced by ultraviolet photoexcitation
  • The experimental results accompanied by the density functional theory calculations reveal that AB stacking of graphitic domains of GO layers coincides within ∼40 ps with photoinduced removal of the epoxy-oxygen from the basal plane of GO via the strong interactions between the GO layers
  • The experimental results accompanied by the density functional theory calculations reveal that AB stacking of graphitic domains of Graphene oxide layers coincides within ∼40 ps with photoinduced removal of the epoxy-oxygen from the basal plane of GO via the strong interactions between the GO layers

Need more features? Save interactive summary cards to your Scholarcy Library.